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  In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates

Chen, Y., Schneider, P., & Erbe, A. (2011). In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates. Talk presented at 62nd Annual Meeting of the International Society of Electrochemistry. Niigata, Japan. 2011-09-11 - 2011-09-16.

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 Creators:
Chen, Y.1, Author           
Schneider, P.1, Author           
Erbe, A.1, Author           
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 580579
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Title: 62nd Annual Meeting of the International Society of Electrochemistry
Place of Event: Niigata, Japan
Start-/End Date: 2011-09-11 - 2011-09-16

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