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  Dislocation imaging by electron channeling contrast under controlled diffraction conditions in the SEM

Gutierrez-Urrutia, I., & Raabe, D. (2011). Dislocation imaging by electron channeling contrast under controlled diffraction conditions in the SEM. Talk presented at Microscopy Conference MC 2011. Kiel, Germany. 2011-08-28 - 2011-09-02.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-304F-C Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3051-4
Genre: Talk

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 Creators:
Gutierrez-Urrutia, I.1, Author              
Raabe, D.1, Author              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 572700
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Title: Microscopy Conference MC 2011
Place of Event: Kiel, Germany
Start-/End Date: 2011-08-28 - 2011-09-02

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