Investigation of oxide growth on zinc by spectroscopic ellipsometry

Chen, Y.; Zuo, J.; Schneider, P.; Erbe, A.

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Investigation of oxide growth on zinc by spectroscopic ellipsometry

Chen, Y., Zuo, J., Schneider, P., & Erbe, A. (2011). Investigation of oxide growth on zinc by spectroscopic ellipsometry. Poster presented at ENFI 2011, Linz, Austria.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-30CA-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-8EB3-4

Genre: Poster

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Creators:
Chen, Y.¹, Author
Zuo, J.², Author
Schneider, P.¹, Author
Erbe, A.¹, Author

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
2External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Created: 2011-07

Publication Status: Not specified

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Identifiers: eDoc: 580620

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Title: ENFI 2011

Place of Event: Linz, Austria

Start-/End Date: 2011-07-19 - 2011-07-20

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