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  EPR parameters of the dangling bond defect in crystalline and amorphous silicon: A DFT-study

Pfanner, G., Freysoldt, C., & Neugebauer, J. (2011). EPR parameters of the dangling bond defect in crystalline and amorphous silicon: A DFT-study. Poster presented at MultiScale Modelling of Amorphous Materials: From Structure to Mechanical Properties, Dublin, Ireland.

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 Creators:
Pfanner, G.1, Author              
Freysoldt, C.1, Author              
Neugebauer, J.2, Author              
Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342              
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

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Language(s): eng - English
 Dates: 2011-07-04
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 575329
 Degree: -

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Title: MultiScale Modelling of Amorphous Materials: From Structure to Mechanical Properties
Place of Event: Dublin, Ireland
Start-/End Date: 2011-07-04

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