Characterization of CI(G)S thin-film solar cells using atom probe tomography

Cojocaru-Mirédin, O.; Choi, P.; Abou-Ras, D.; Wuerz, R.; Raabe, D.

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Characterization of CI(G)S thin-film solar cells using atom probe tomography

Cojocaru-Mirédin, O., Choi, P., Abou-Ras, D., Wuerz, R., & Raabe, D. (2011). Characterization of CI(G)S thin-film solar cells using atom probe tomography. Talk presented at 37th IEEE Photovoltaic Specialists Conference (PVSC). Seattle, WA, USA. 2011-06-19 - 2011-06-24.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3180-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-42C5-6

Genre: Talk

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Creators:
Cojocaru-Mirédin, O.¹, Author
Choi, P.¹, Author
Abou-Ras, D., Author
Wuerz, R., Author
Raabe, D.², Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2011-06

Publication Status: Not specified

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Identifiers: eDoc: 562704

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Title: 37th IEEE Photovoltaic Specialists Conference (PVSC)

Place of Event: Seattle, WA, USA

Start-/End Date: 2011-06-19 - 2011-06-24

Invited: Yes

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