A Detailed Investigation of Native and Light-induced Defects in Hydrogenated 
Amorphous Silicon by Electron-spin Resonance

Fehr, M.; Schnegg, A.; Teutloff, C.; Bittl, R.; Astakhov, O.; Finger, F.; Pfanner, G.; Freysoldt, C.; Neugebauer, J.; Rech, B.; Lips, K.

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A Detailed Investigation of Native and Light-induced Defects in Hydrogenated Amorphous Silicon by Electron-spin Resonance

Fehr, M., Schnegg, A., Teutloff, C., Bittl, R., Astakhov, O., Finger, F., et al. (2011). A Detailed Investigation of Native and Light-induced Defects in Hydrogenated Amorphous Silicon by Electron-spin Resonance. Talk presented at MRS Spring Meeting and Exhibit 2011. San Francisco, CA, USA. 2011-04-26.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3234-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3236-3

Genre: Talk

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Creators:
Fehr, M., Author
Schnegg, A., Author
Teutloff, C., Author
Bittl, R., Author
Astakhov, O., Author
Finger, F., Author
Pfanner, G.¹, Author
Freysoldt, C.¹, Author
Neugebauer, J.², Author
Rech, B., Author
Lips, K., Author

Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 575328

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Title: MRS Spring Meeting and Exhibit 2011

Place of Event: San Francisco, CA, USA

Start-/End Date: 2011-04-26

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