A new large-area mapping technique to improve the statistical reliability of 
EBSD datasets

Davut, K.; Zaefferer, S.

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A new large-area mapping technique to improve the statistical reliability of EBSD datasets

Davut, K., & Zaefferer, S. (2011). A new large-area mapping technique to improve the statistical reliability of EBSD datasets. Talk presented at Royal Microscopy Society (RMS) EBSD 2011 Meeting. Düsseldorf, Germany. 2011-03-28 - 2011-03-30.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3271-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3273-A

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Creators:
Davut, K.¹, Author
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 580676

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Title: Royal Microscopy Society (RMS) EBSD 2011 Meeting

Place of Event: Düsseldorf, Germany

Start-/End Date: 2011-03-28 - 2011-03-30

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