EPR parameters of the dangling bond defect in crystalline and amorphous silion: 
A DFT-study

Pfanner, G.; Freysoldt, C.; Neugebauer, J.

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EPR parameters of the dangling bond defect in crystalline and amorphous silion: A DFT-study

Pfanner, G., Freysoldt, C., & Neugebauer, J. (2011). EPR parameters of the dangling bond defect in crystalline and amorphous silion: A DFT-study. Talk presented at APS march meeting 2011. Dallas, TX, USA. 2011-03-22.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-327D-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-327F-1

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Creators:
Pfanner, G.¹, Author
Freysoldt, C.¹, Author
Neugebauer, J.², Author

Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 572594

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Title: APS march meeting 2011

Place of Event: Dallas, TX, USA

Start-/End Date: 2011-03-22

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