Application of thin-film interference coatings in infrared reflection 
spectroscopy of organic samples in contact with thin metal films

Reithmeier, M.; Erbe, A.

doi:10.1364/AO.50.00C301

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Application of thin-film interference coatings in infrared reflection spectroscopy of organic samples in contact with thin metal films

Reithmeier, M., & Erbe, A. (2011). Application of thin-film interference coatings in infrared reflection spectroscopy of organic samples in contact with thin metal films. Applied Optics, 50(9), C301-C308. doi:10.1364/AO.50.00C301.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3289-9 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-328B-5

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Urheber:
Reithmeier, M.¹, Autor
Erbe, A.¹, Autor

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358