Treatment of Smearing in Ellipsometry

Sigel, R.; Erbe, A.

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Treatment of Smearing in Ellipsometry

Sigel, R., & Erbe, A. (2011). Treatment of Smearing in Ellipsometry. In Proceedings of the Workshop Nano Structures on Surfaces and Light Scattering (pp. 55-58).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-32FE-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3300-2

Genre: Conference Paper

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Creators:
Sigel, R., Author
Erbe, A.¹, Author

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358

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Language(s): eng - English

Dates: Date issued: 2011-03

Publication Status: Issued

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Identifiers: eDoc: 580535

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Title: Workshop "Nano structures on surfaces and light scattering"

Place of Event: Institut für Werkstofftechnik, IWT, Bremen, Germany

Start-/End Date: 2011-03-24 - 2011-03-25

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Title: Proceedings of the Workshop Nano Structures on Surfaces and Light Scattering

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 55 - 58 Identifier: -