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  Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design

Valtiner, M., Ankah, G. N., Bashir, A., & Renner, F. U. (2011). Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design. Review of Scientific Instruments, 82(2), 023703-1-023703-8. doi:10.1063/1.3541650.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-336F-E Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3371-6
Genre: Journal Article

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 Creators:
Valtiner, M.1, Author              
Ankah, G. N.2, Author              
Bashir, A.2, Author              
Renner, F. U.3, Author              
Affiliations:
1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              
2Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
3Interface Structures and High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society

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Language(s): eng - English
 Dates: 2011-02
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 579610
DOI: 10.1063/1.3541650
 Degree: -

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Title: Review of Scientific Instruments
  Alternative Title : Rev. Sci. Instrum.
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 82 (2) Sequence Number: - Start / End Page: 023703-1 - 023703-8 Identifier: -