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  A (S)TEM and atom probe tomography study of InGaN

Mehrtens, T., Bley, S., Schowalter, M., Sebald, K., Seyfried, M., Gutowski, J., et al. (2011). A (S)TEM and atom probe tomography study of InGaN. Journal of Physics, Conference Series, 326(012029), 1-4.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3465-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3467-5
Genre: Conference Paper

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 Creators:
Mehrtens, T., Author
Bley, S., Author
Schowalter, M., Author
Sebald, K., Author
Seyfried, M., Author
Gutowski, J., Author
Gerstl, S. A., Author
Choi, P.1, Author           
Raabe, D.2, Author           
Rosenauer, A., Author
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 576294
URI: http://iopscience.iop.org/1742-6596/326/1/012029
DOI: 10.1088/1742-6596/326/1/012029
 Degree: -

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Title: 17th International Conference on Microscopy of Semiconducting Materials 2011
Place of Event: Churchill College, University of Cambridge, UK
Start-/End Date: 2011-04-04 - 2011-04-07

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Title: Journal of Physics, Conference Series
  Alternative Title : J. Phys., Conf. Ser.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 326 (012029) Sequence Number: - Start / End Page: 1 - 4 Identifier: -