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  Characterization of grain boundaries in Cu(In,Ga)Se2 films using atom probe tomography

Cojocaru-Mirédin, O., Choi, P., Abou-Ras, D., Schmidt, S. S., Caballero, R., & Raabe, D. (2011). Characterization of grain boundaries in Cu(In,Ga)Se2 films using atom probe tomography. Journal of Photovoltaics, 1, 207-212.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-34BC-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-34BE-1
Genre: Journal Article

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 Creators:
Cojocaru-Mirédin, O.1, Author              
Choi, P.1, Author              
Abou-Ras, D., Author
Schmidt, S. S., Author
Caballero, R., Author
Raabe, D.2, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2011
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 580662
 Degree: -

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Title: Journal of Photovoltaics
Source Genre: Journal
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Pages: - Volume / Issue: 1 Sequence Number: - Start / End Page: 207 - 212 Identifier: -