Quantitative Atomic Force Microscopy Characterization and Crystal Plasticity 
Finite Element Modeling of Heterogeneous Deformation in Commercial Purity 
Titanium

Yang, Y.; Wang, L.; Bieler, T.; Eisenlohr, P.; Crimp, M.

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Quantitative Atomic Force Microscopy Characterization and Crystal Plasticity Finite Element Modeling of Heterogeneous Deformation in Commercial Purity Titanium

Yang, Y., Wang, L., Bieler, T., Eisenlohr, P., & Crimp, M. (2011). Quantitative Atomic Force Microscopy Characterization and Crystal Plasticity Finite Element Modeling of Heterogeneous Deformation in Commercial Purity Titanium. Metallurgical and Materials Transactions A, 42(3), 636-644.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-34C4-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-34C6-D

Genre: Journal Article

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Creators:
Yang, Y., Author
Wang, L., Author
Bieler, T., Author
Eisenlohr, P.¹, Author
Crimp, M., Author

Affiliations:
1MPG-FhG Computational Mechanics of Polycrystals Group, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863389

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Language(s): eng - English

Dates: Date issued: 2011

Publication Status: Issued

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Identifiers: eDoc: 580679

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Title: Metallurgical and Materials Transactions A

Alternative Title : Metal. Mater. Trans. A

Source Genre: Journal

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Pages: - Volume / Issue: 42 (3) Sequence Number: - Start / End Page: 636 - 644 Identifier: -