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  Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films

Abou-Ras, D., Caballero, R., Fischer, C.-H., Kaufmann, C., Lauermann, I., Mainz, R., et al. (2011). Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films. Microscopy and Microanalysis, 17, 728-751.

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 Creators:
Abou-Ras, D., Author
Caballero, R., Author
Fischer, C.-H., Author
Kaufmann, C., Author
Lauermann, I., Author
Mainz, R., Author
Mönig, H., Author
Schöpke, A., Author
Stephan, C., Author
Streeck, C., Author
Schorr, S., Author
Eicke, A., Author
Döbeli, M., Author
Gade, B., Author
Hinrichs, J., Author
Nunney, T., Author
Dijkstra, H., Author
Hoffmann, V., Author
Klemm, D., Author
Efimova, V., Author
Bergmaier, A., AuthorDollinger, G., AuthorWirth, T., AuthorUnger, W., AuthorRockett, A. A., AuthorPerez Rodriguez, A., AuthorAlvarez Garcia, J., AuthorIzquierdo-Roca, V., AuthorSchmid, T., AuthorChoi, P.1, Author           Müller, M., AuthorBertram, F., AuthorChristen, J., AuthorKhatri, H., AuthorCollins, R. W., AuthorMarsillac, S., AuthorKötschau, I., Author more..
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 624666
 Degree: -

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Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 17 Sequence Number: - Start / End Page: 728 - 751 Identifier: -