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  Strain-induced effects on the electronic structure and N K-edge ELNES of wurtzite AlN and AlxGa1-xN

Petrov, M., Holec, D., Lymperakis, L., Neugebauer, J., & Humphreys, C. J. (2011). Strain-induced effects on the electronic structure and N K-edge ELNES of wurtzite AlN and AlxGa1-xN. Journal of Physics Conference Series, 326, 012016-1-012016-5.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3525-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3527-D
Genre: Conference Paper

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 Creators:
Petrov, M.1, Author              
Holec, D., Author
Lymperakis, L.2, Author              
Neugebauer, J.3, Author              
Humphreys, C. J., Author
Affiliations:
1Ab Initio Thermodynamics, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863338              
2Microstructure, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863344              
3Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

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Language(s): eng - English
 Dates: 2011
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 625768
DOI: 10.1088/1742-6596/326/1/012016
 Degree: -

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Title: 17th International Conference on Microscopy of Semiconducting Materials 2011
Place of Event: University of Cambridge, UK
Start-/End Date: 2011-04-04 - 2011-04-07

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Title: Journal of Physics Conference Series
  Alternative Title : J. Phys.: Conf. Ser.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: IOP Publishing
Pages: - Volume / Issue: 326 Sequence Number: - Start / End Page: 012016-1 - 012016-5 Identifier: -