Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction

Keil, P.; Salgin, B.; Vogel, D.; Rohwerder, M.

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Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction

Keil, P., Salgin, B., Vogel, D., & Rohwerder, M. (2010). Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction. Talk presented at Institute for X-Ray Physics, University of Göttingen. Göttingen, Germany. 2010-10-01.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-366B-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-42EA-3

Genre: Talk

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Creators:
Keil, P.¹, Author
Salgin, B.², Author
Vogel, D.³, Author
Rohwerder, M.^{2, 4}, Author

Affiliations:
1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353
2Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
3Interface Structures and High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_persistent22
4Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

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Language(s): eng - English

Dates: Created: 2010-10

Publication Status: Not specified

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Identifiers: eDoc: 516784

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Title: Institute for X-Ray Physics, University of Göttingen

Place of Event: Göttingen, Germany

Start-/End Date: 2010-10-01

Invited: Yes

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