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  Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction

Keil, P., Salgin, B., Vogel, D., & Rohwerder, M. (2010). Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction. Talk presented at Institute for X-Ray Physics, University of Göttingen. Göttingen, Germany. 2010-10-01.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-366B-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-42EA-3
Genre: Talk

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 Creators:
Keil, P.1, Author              
Salgin, B.2, Author              
Vogel, D.3, Author              
Rohwerder, M.2, 4, Author              
Affiliations:
1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              
2Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
3Interface Structures and High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_persistent22              
4Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352              

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Language(s): eng - English
 Dates: 2010-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 516784
 Degree: -

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Title: Institute for X-Ray Physics, University of Göttingen
Place of Event: Göttingen, Germany
Start-/End Date: 2010-10-01
Invited: Yes

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