Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry

Chen, Y.; Zuo, J.; Schneider, P.; Erbe, A.

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Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry

Chen, Y., Zuo, J., Schneider, P., & Erbe, A. (2010). Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry. Poster presented at 3rd NanoCharm Workshop on Non-Destructive Real Time Process Control, Berlin, Germany.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3673-8 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0002-9176-5

Genre: Poster

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Urheber:
Chen, Y.¹, Autor
Zuo, J.², Autor
Schneider, P.¹, Autor
Erbe, A.¹, Autor

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
2External Organizations, ou_persistent22