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  EPR hyperfine tensors of the dangling bond defect in crystalline and amorphous silicon

Pfanner, G., Freysoldt, C., & Neugebauer, J. (2010). EPR hyperfine tensors of the dangling bond defect in crystalline and amorphous silicon. Poster presented at Psi-k Conference 2010, Berlin, Germany.

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 Creators:
Pfanner, G.1, Author           
Freysoldt, C.1, Author           
Neugebauer, J.2, Author           
Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342              
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

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Language(s): eng - English
 Dates: 2010-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 498775
 Degree: -

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Title: Psi-k Conference 2010
Place of Event: Berlin, Germany
Start-/End Date: 2010-09-12 - 2010-09-16

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