Surface Topographies after Nanoindentation and their Utilization to Quantify 
the Plastic Anisotropy of Gamma-TiAl on the Single Crystal Length Scale

Zambaldi, C.; Roters, F.; Zaefferer, S.; Raabe, D.

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Surface Topographies after Nanoindentation and their Utilization to Quantify the Plastic Anisotropy of Gamma-TiAl on the Single Crystal Length Scale

Zambaldi, C., Roters, F., Zaefferer, S., & Raabe, D. (2010). Surface Topographies after Nanoindentation and their Utilization to Quantify the Plastic Anisotropy of Gamma-TiAl on the Single Crystal Length Scale. Talk presented at Materials Science and Engineering MSE 2010. Darmstadt, Germany. 2010-08-24 - 2010-08-26.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3779-3 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-377B-0

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Urheber:
Zambaldi, C.¹, Autor
Roters, F.¹, Autor
Zaefferer, S.², Autor
Raabe, D.³, Autor

Affiliations:
1Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392
2Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381