Atom Probe Tomography characterization of heavily cold drawn pearlitic steel 
wire

Li, Y. J.; Choi, P.; Borchers, C.; Chen, Y.Z.; Goto, S.; Raabe, D.; Kirchheim, R.

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Atom Probe Tomography characterization of heavily cold drawn pearlitic steel wire

Li, Y. J., Choi, P., Borchers, C., Chen, Y., Goto, S., Raabe, D., et al. (2010). Atom Probe Tomography characterization of heavily cold drawn pearlitic steel wire. Talk presented at 52nd International Field Emission Symposium (IFES). Sydney, Australia. 2010-07-05 - 2010-07-08.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-382B-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-382D-B

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Urheber:
Li, Y. J.^{1, 2}, Autor
Choi, P.¹, Autor
Borchers, C., Autor
Chen, Y.Z., Autor
Goto, S.³, Autor
Raabe, D.³, Autor
Kirchheim, R.³, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381