Antireflective layers on thin metal films for mid‐infrared internal reflection 
spectroscopy

Reithmeier, M.; Erbe, A.

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Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy

Reithmeier, M., & Erbe, A. (2010). Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Talk presented at Optical Interference Coatings - Topical Meeting. Tucson, Arizona, USA. 2010-06 - 2010-06.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-38F4-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-38F6-7

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Creators:
Reithmeier, M.¹, Author
Erbe, A.¹, Author

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 476855

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Title: Optical Interference Coatings - Topical Meeting

Place of Event: Tucson, Arizona, USA

Start-/End Date: 2010-06 - 2010-06

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