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  Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy

Reithmeier, M., & Erbe, A. (2010). Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Poster presented at Optical Interference Coatings - Topical Meeting, Tucson, AZ, USA.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-38F8-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-902B-B
Genre: Poster

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 Creators:
Reithmeier, M.1, Author              
Erbe, A.1, Author              
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
 Dates: 2010-06
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 476862
 Degree: -

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Title: Optical Interference Coatings - Topical Meeting
Place of Event: Tucson, AZ, USA
Start-/End Date: 2010-06

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