Numerical Investigation of Electrode Surface Potential Mapping with Scanning 
Electrochemical Potential Microscopy

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.

Local TagsRelease HistoryDetailsSummary

Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy

Hamou, R. F., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2010). Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy. Talk presented at The 12th International Scanning Probe Microscopy Conference. Sapporo, Japan. 2010-05-09 - 2010-05-12.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-393A-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-393C-1

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Hamou, R. F.¹, Author
Biedermann, P. U.², Author
Erbe, A.³, Author
Rohwerder, M.^{1, 4}, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
4Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 476018

Degree: -

Event

show

hide

Title: The 12th International Scanning Probe Microscopy Conference

Place of Event: Sapporo, Japan

Start-/End Date: 2010-05-09 - 2010-05-12

Legal Case

show

Project information

show

Source

show