3D orientation microscopy based on FIB-EBSD tomography: Potentials and limits

Zaefferer, S.

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3D orientation microscopy based on FIB-EBSD tomography: Potentials and limits

Zaefferer, S. (2010). 3D orientation microscopy based on FIB-EBSD tomography: Potentials and limits. Talk presented at Advanced Methods in Electron Backscatter Diffraction. St. Etienne, France. 2010-05-06.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-393E-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3940-6

Genre: Talk

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Creators:
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 498747

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Title: Advanced Methods in Electron Backscatter Diffraction

Place of Event: St. Etienne, France

Start-/End Date: 2010-05-06

Invited: Yes

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