Numerical simulation of probing the electric double layer by scanning 
electrochemical Potential microscopy

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.

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Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy

Hamou, R. F., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2010). Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy. Talk presented at 217th ECS Meeting. Vancouver, Canada. 2010-04-25 - 2010-04-30.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3976-0 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3978-C

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Urheber:
Hamou, R. F.¹, Autor
Biedermann, P. U.², Autor
Erbe, A.³, Autor
Rohwerder, M.^{1, 4}, Autor

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
4Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352