SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of 
Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface

Bashir, A.; Muglali, M. I.; Hamou, R. F.; Rohwerder, M.

Local TagsRelease HistoryDetailsSummary

SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface

Bashir, A., Muglali, M. I., Hamou, R. F., & Rohwerder, M. (2010). SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface. Talk presented at 217th ECS Meeting. Vancouver, Canada. 2010-04-25 - 2010-04-30.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-397A-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-397C-4

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Bashir, A.¹, Author
Muglali, M. I.¹, Author
Hamou, R. F.¹, Author
Rohwerder, M.^{1, 2}, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 476019

Degree: -

Event

show

hide

Title: 217th ECS Meeting

Place of Event: Vancouver, Canada

Start-/End Date: 2010-04-25 - 2010-04-30

Legal Case

show

Project information

show

Source

show