Bashir, A., Muglali, M. I., Hamou, R. F., & Rohwerder, M. (2010). SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface. Talk presented at 217th ECS Meeting. Vancouver, Canada. 2010-04-25 - 2010-04-30.