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  Numerical analysis of Debye screening effect in electrode surface potential mapping by scanning electrochemical potential microscopy

Hamou, F. R., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2010). Numerical analysis of Debye screening effect in electrode surface potential mapping by scanning electrochemical potential microscopy. Electrochemistry Communucations, 12(10), 1391-1394. doi:10.1016/j.elecom.2010.07.028.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3BEE-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-6B35-7
Genre: Journal Article

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 Creators:
Hamou, Fayçal Riad1, Author              
Biedermann, Paul Ulrich2, Author              
Erbe, Andreas3, Author              
Rohwerder, Michael1, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350              
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
 Dates: 2010-10
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 494256
DOI: 10.1016/j.elecom.2010.07.028
 Degree: -

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Title: Electrochemistry Communucations
  Abbreviation : Electrochem. Commun.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY : Elsevier
Pages: - Volume / Issue: 12 (10) Sequence Number: - Start / End Page: 1391 - 1394 Identifier: ISSN: 1388-2481
CoNE: https://pure.mpg.de/cone/journals/resource/954925622231