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  Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy

Keil, P., Frahm, R., & Lützenkirchen-Hecht, D. (2010). Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy. Corrosion Science, 52, 1305-1305.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3C4F-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3C51-A
Genre: Journal Article

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 Creators:
Keil, P.1, Author              
Frahm, R., Author
Lützenkirchen-Hecht, D., Author
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1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Published in print
 Pages: -
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 Rev. Method: -
 Identifiers: eDoc: 498837
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Title: Corrosion Science
Source Genre: Journal
 Creator(s):
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Pages: - Volume / Issue: 52 Sequence Number: - Start / End Page: 1305 - 1305 Identifier: -