Native oxidation of sputter deposited polycrystalline copper thin films during 
short and long exposure times: Comparative investigation by specular and 
non-specular grazing incidence X-ray absorption spectroscopy

Keil, P.; Frahm, R.; Lützenkirchen-Hecht, D.

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Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy

Keil, P., Frahm, R., & Lützenkirchen-Hecht, D. (2010). Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy. Corrosion Science, 52, 1305-1305.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3C4F-1 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3C51-A

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Urheber:
Keil, P.¹, Autor
Frahm, R., Autor
Lützenkirchen-Hecht, D., Autor

Affiliations:
1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353