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  Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy

Reithmeier, M., & Erbe, A. (2010). Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy. Physical Chemistry Chemical Physics, 12, 14798-14803. doi:10.1039/C0CP01125H.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3C5F-E Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3C61-6
Genre: Journal Article

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 Creators:
Reithmeier, M.1, Author              
Erbe, A.1, Author              
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 499343
DOI: 10.1039/C0CP01125H
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Title: Physical Chemistry Chemical Physics
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 12 Sequence Number: - Start / End Page: 14798 - 14803 Identifier: -