Dielectric interlayers increasing the transparency of metal films for 
mid-infrared attenuated total reflection spectroscopy

Reithmeier, M.; Erbe, A.

doi:10.1039/C0CP01125H

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Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy

Reithmeier, M., & Erbe, A. (2010). Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy. Physical Chemistry Chemical Physics, 12, 14798-14803. doi:10.1039/C0CP01125H.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3C5F-E Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3C61-6

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Urheber:
Reithmeier, M.¹, Autor
Erbe, A.¹, Autor

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358