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  Antireflective Layers on Thin Metal Films for Mid-Infrared Internal Reflection Spectroscopy

Reithmeier, M., & Erbe, A. (2010). Antireflective Layers on Thin Metal Films for Mid-Infrared Internal Reflection Spectroscopy. In Optical Interference Coatings (OIC) (pp. 1-3). Washington, D.C., USA: Optical Society of America (OSA).

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 Creators:
Reithmeier, M.1, Author              
Erbe, A.1, Author              
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 499347
 Degree: -

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Title: Measurement III (ThE)
Place of Event: Tucson, AZ, USA
Start-/End Date: 2010-06-06 - 2010-06-06

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Title: Optical Interference Coatings (OIC)
Source Genre: Proceedings
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Publ. Info: Washington, D.C., USA : Optical Society of America (OSA)
Pages: 3 Volume / Issue: - Sequence Number: - Start / End Page: 1 - 3 Identifier: -