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  Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces

Rohwerder, M., Isik-Uppenkamp, S., & Stratmann, M. (2009). Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces. Electrochimica Acta, 54(25), 6058-6062. doi:10.1016/j.electacta.2009.03.012.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3E1A-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-6B15-F
Genre: Journal Article

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 Creators:
Rohwerder, Michael1, Author              
Isik-Uppenkamp, Sonnur1, Author              
Stratmann, Martin2, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

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Language(s): eng - English
 Dates: 2009-10-30
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 452343
DOI: 10.1016/j.electacta.2009.03.012
 Degree: -

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Title: Electrochimica Acta
  Abbreviation : Electrochim. Acta
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Oxford, UK : Pergamon-Elsevier Science Ltd
Pages: - Volume / Issue: 54 (25) Sequence Number: - Start / End Page: 6058 - 6062 Identifier: ISSN: 0013-4686
CoNE: https://pure.mpg.de/cone/journals/resource/954925396434