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  Screening effects in probing the double layer by scanning electrochemical potential microscopy

Hamou, R. F., Erbe, A., & Rohwerder, M. (2009). Screening effects in probing the double layer by scanning electrochemical potential microscopy. Poster presented at Comsol European Conference October 2009, Milan, Italy.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-3EC7-1 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-924F-1
Genre: Poster

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 Creators:
Hamou, R. F.1, Author              
Erbe, A.2, Author              
Rohwerder, M.1, 3, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              
3Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352              

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Language(s): eng - English
 Dates: 2009-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 450852
 Degree: -

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Title: Comsol European Conference October 2009
Place of Event: Milan, Italy
Start-/End Date: 2009-10

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