Screening effects in probing the double layer by scanning electrochemical 
potential microscopy

Hamou, R. F.; Erbe, A.; Rohwerder, M.

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Screening effects in probing the double layer by scanning electrochemical potential microscopy

Hamou, R. F., Erbe, A., & Rohwerder, M. (2009). Screening effects in probing the double layer by scanning electrochemical potential microscopy. Poster presented at Comsol European Conference October 2009, Milan, Italy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3EC7-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-924F-1

Genre: Poster

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Creators:
Hamou, R. F.¹, Author
Erbe, A.², Author
Rohwerder, M.^{1, 3}, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
3Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

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Language(s): eng - English

Dates: Created: 2009-10

Publication Status: Not specified

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Identifiers: eDoc: 450852

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Title: Comsol European Conference October 2009

Place of Event: Milan, Italy

Start-/End Date: 2009-10

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