3D-orientation microscopy using FIB–EBSD tomography: An overview on techniques, 
applications and limits

Zaefferer, S.

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3D-orientation microscopy using FIB–EBSD tomography: An overview on techniques, applications and limits

Zaefferer, S. (2009). 3D-orientation microscopy using FIB–EBSD tomography: An overview on techniques, applications and limits. Talk presented at 158th ISIJ Meeting. Kyoto, Japan. 2009-09-15.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3F5C-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3F5E-5

Genre: Talk

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Creators:
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 498744

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Title: 158th ISIJ Meeting

Place of Event: Kyoto, Japan

Start-/End Date: 2009-09-15

Invited: Yes

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