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  What can EPR hyperfine parameters tell about the Si dangling bond? - A theoretical study

Freysoldt, C., Pfanner, G., & Neugebauer, J. (2009). What can EPR hyperfine parameters tell about the Si dangling bond? - A theoretical study. Talk presented at International conference on amorphous and nanoporous semiconductors (ICANS) 23. Utrecht, Netherlands. 2009-08-24 - 2009-08-28.

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 Creators:
Freysoldt, C.1, Author              
Pfanner, G.1, Author              
Neugebauer, J.2, Author              
Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342              
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

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 Publication Status: Not specified
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 Identifiers: eDoc: 441562
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Title: International conference on amorphous and nanoporous semiconductors (ICANS) 23
Place of Event: Utrecht, Netherlands
Start-/End Date: 2009-08-24 - 2009-08-28

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