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  Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM)

Hamou, R. F., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2009). Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). Talk presented at 11th International Fischer Symposium on Microscopy in Electrochemistry. Benediktbeuern, Germany. 2009-07 - 2009-07.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-4084-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-4086-F
Genre: Talk

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 Creators:
Hamou, R. F.1, Author              
Biedermann, P. U.2, Author              
Erbe, A.3, Author              
Rohwerder, M.1, 4, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350              
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              
4Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 446606
 Degree: -

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Title: 11th International Fischer Symposium on Microscopy in Electrochemistry
Place of Event: Benediktbeuern, Germany
Start-/End Date: 2009-07 - 2009-07

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