3D orientation microscopy by EBSD-FIB tomography: What can be done, what can't?

Zaefferer, S.

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3D orientation microscopy by EBSD-FIB tomography: What can be done, what can't?

Zaefferer, S. (2009). 3D orientation microscopy by EBSD-FIB tomography: What can be done, what can't?. Talk presented at AGH - ZEISS Workshop on Focused Ion Beam techniques. Krakow, Poland. 2009-06-09.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-40BA-A Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-40BC-6

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Urheber:
Zaefferer, S.¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391