Fully ab initio supercell corrections for charged defects

Freysoldt, C.; Neugebauer, J.; Van de Walle, C. G.

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Fully ab initio supercell corrections for charged defects

Freysoldt, C., Neugebauer, J., & Van de Walle, C. G. (2009). Fully ab initio supercell corrections for charged defects. Talk presented at CECAM workshop "Which Electronic Structure Method for the Study of Defects?". Lausanne, Switzerland. 2009-06-08 - 2009-06-10.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-40C6-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-40C5-1

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Creators:
Freysoldt, C.¹, Author
Neugebauer, J.², Author
Van de Walle, C. G., Author

Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337

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Dates: Created: 2009-06

Publication Status: Not specified

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Identifiers: eDoc: 441558

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Title: CECAM workshop "Which Electronic Structure Method for the Study of Defects?"

Place of Event: Lausanne, Switzerland

Start-/End Date: 2009-06-08 - 2009-06-10

Invited: Yes

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