Dielectric layers as antireflective coatings for ATR-IR spectroscopy

Reithmeier, M.; Erbe, A.

Local TagsRelease HistoryDetailsSummary

Dielectric layers as antireflective coatings for ATR-IR spectroscopy

Reithmeier, M., & Erbe, A. (2009). Dielectric layers as antireflective coatings for ATR-IR spectroscopy. Poster presented at 4th International workshop on vibrational spectroscopy of thin films (VSM4), Potsdam, Germany.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-40E7-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-90FC-F

Genre: Poster

Files

show Files

Locators

show

Creators

show

hide

Creators:
Reithmeier, M.¹, Author
Erbe, A.¹, Author

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2009-06

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 450861

Degree: -

Event

show

hide

Title: 4th International workshop on vibrational spectroscopy of thin films (VSM4)

Place of Event: Potsdam, Germany

Start-/End Date: 2009-06

Legal Case

show

Project information

show

Source

show