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  Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction

Zambaldi, C., Zaefferer, S., & Wright, S. I. (2009). Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction. Journal of Applied Crystallography, 42, 1092-1101.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-43AD-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-43AF-C
Genre: Journal Article

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ZamZaeWri2009_Characterization of TiAl order domains by EBSD.pdf (Any fulltext), 2MB
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Zambaldi, C.1, Author           
Zaefferer, S.2, Author           
Wright, S. I., Author
Affiliations:
1Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392              
2Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: eDoc: 439331
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Title: Journal of Applied Crystallography
  Alternative Title : J. Appl. Cryst.
Source Genre: Journal
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Pages: - Volume / Issue: 42 Sequence Number: - Start / End Page: 1092 - 1101 Identifier: ISSN: 0021-8898