Advances in TEM orientation microscopy by combination of dark-field conical 
scanning and improved image matching

Wu, G.; Zaefferer, S.

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Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching

Wu, G., & Zaefferer, S. (2009). Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching. Ultramicroscopy, 109, 1317-1325.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4475-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4477-F

Genre: Journal Article

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Creators:
Wu, G.¹, Author
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

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Identifiers: eDoc: 498760

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Title: Ultramicroscopy

Source Genre: Journal

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Pages: - Volume / Issue: 109 Sequence Number: - Start / End Page: 1317 - 1325 Identifier: -