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  FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM)

Hamou, R. F., Biedermann, P. U., Rohwerder, M., & Blumenau, A. T. (2008). FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). Talk presented at Comsol European Conference 2008. Hannover, Germany. 2008-11-04 - 2008-11-06.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-4571-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-4573-F
Genre: Talk

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 Creators:
Hamou, R. F.1, Author              
Biedermann, P. U.2, Author              
Rohwerder, M.1, 3, Author              
Blumenau, A. T.2, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Atomistic Modelling in Interface Science, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863351              
3Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 372735
 Degree: -

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Title: Comsol European Conference 2008
Place of Event: Hannover, Germany
Start-/End Date: 2008-11-04 - 2008-11-06

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