In-Situ Investigation of Creep and Creep Damage Using Synchrotron 
Microtomography

Sket, F.; Dzieciol, K.; Isaac, A.; Sauthoff, G.; Borbély, A.; Pyzalla, A. R.

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In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography

Sket, F., Dzieciol, K., Isaac, A., Sauthoff, G., Borbély, A., & Pyzalla, A. R. (2008). In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography. Talk presented at Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms. Dresden, Germany. 2008-10-22 - 2008-10-24.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-459B-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-459D-6

Genre: Talk

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Creators:
Sket, F.¹, Author
Dzieciol, K.¹, Author
Isaac, A.¹, Author
Sauthoff, G.², Author
Borbély, A.¹, Author
Pyzalla, A. R.³, Author

Affiliations:
1Synchrotron and Neutron Methods, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863366
2High Temperature Materials, Physical Metallurgy, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863396
3Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863361

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Language(s): eng - English

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Identifiers: eDoc: 380058

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Title: Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms

Place of Event: Dresden, Germany

Start-/End Date: 2008-10-22 - 2008-10-24

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