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  In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography

Sket, F., Dzieciol, K., Isaac, A., Sauthoff, G., Borbély, A., & Pyzalla, A. R. (2008). In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography. Talk presented at Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms. Dresden, Germany. 2008-10-22 - 2008-10-24.

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 Creators:
Sket, F.1, Author           
Dzieciol, K.1, Author           
Isaac, A.1, Author           
Sauthoff, G.2, Author           
Borbély, A.1, Author           
Pyzalla, A. R.3, Author           
Affiliations:
1Synchrotron and Neutron Methods, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863366              
2High Temperature Materials, Physical Metallurgy, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863396              
3Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863361              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 380058
 Degree: -

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Title: Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms
Place of Event: Dresden, Germany
Start-/End Date: 2008-10-22 - 2008-10-24

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