Sket, F., Dzieciol, K., Isaac, A., Sauthoff, G., Borbély, A., & Pyzalla, A. R. (2008). In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography. Talk presented at Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms. Dresden, Germany. 2008-10-22 - 2008-10-24.