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  Structural Characterization of Ag Nanoparticles Embedded in TiO2 Thin Films Prepared by Means of RF-Magnetron Sputtering

Möllmann, V., Keil, P., Zuo, J., Itani, H., Titz, T., & Grundmeier, G. (2008). Structural Characterization of Ag Nanoparticles Embedded in TiO2 Thin Films Prepared by Means of RF-Magnetron Sputtering. Poster presented at AVS fall meeting 2008, Boston, MA, USA.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-459F-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-91F8-2
Genre: Poster

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 Creators:
Möllmann, V., Author
Keil, P.1, Author              
Zuo, J.2, Author              
Itani, H.2, Author              
Titz, T.2, Author              
Grundmeier, G.1, Author              
Affiliations:
1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              
2Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863349              

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Language(s): eng - English
 Dates: 2008-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 395049
 Degree: -

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Title: AVS fall meeting 2008
Place of Event: Boston, MA, USA
Start-/End Date: 2008-10-19 - 2008-10-24

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