English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface

Salgin, B., & Rohwerder, M. (2008). Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface. Poster presented at 2nd International IMPRS-SurMat Workshop, Bochum, Germany.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Salgin, B.1, Author              
Rohwerder, M.1, 2, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2008-07
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 582712
 Degree: -

Event

show
hide
Title: 2nd International IMPRS-SurMat Workshop
Place of Event: Bochum, Germany
Start-/End Date: 2008-07-15 - 2008-07-16

Legal Case

show

Project information

show

Source

show