Effects of the Semiconducting Properties of Surface Oxide on the Delamination 
at the Polymer/Metal Interface

Salgin, B.; Rohwerder, M.

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Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface

Salgin, B., & Rohwerder, M. (2008). Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface. Poster presented at 2nd International IMPRS-SurMat Workshop, Bochum, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4802-A Version Permalink: https://hdl.handle.net/21.11116/0000-0002-8E1E-E

Genre: Poster

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Creators:
Salgin, B.¹, Author
Rohwerder, M.^{1, 2}, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

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Language(s): eng - English

Dates: Created: 2008-07

Publication Status: Not specified

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Identifiers: eDoc: 582712

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Title: 2nd International IMPRS-SurMat Workshop

Place of Event: Bochum, Germany

Start-/End Date: 2008-07-15 - 2008-07-16

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